Advantest has installed its T2000 Integrated Power Device Test Solution at Toyota for evaluating and mass-producing integrated power ICs used in next-generation hybrid cars. Toyota selected the T2000 IPS unit as an essential test system to enhance the safety and reliability of vehicle-mounted devices.
The number of integrated circuits used in vehicles is increasingly expanding: the cars of today require semiconductors for engine control, navigation and an increasing number of other functions. With the mission statement: “creating ever-better cars,” Toyota has been searching for a high-quality semiconductor test solution. This test solution will ensure that Toyota's vehicle-mounted ICs have the increased reliability and expanded productivity required. Advantest’s test solution was selected since it demonstrated the flexibility, high performance and functionality to meet Toyota’s quality requirements for both current and next-generation semiconductor devices.
Satoru Nagumo, executive vice president of Advantest, comments: “Our high-accuracy integrated power IC measurement architecture and the low cost of test achieved by our highly parallel operation are greatly valued by Toyota, the world’s leading automotive company.”
An optimal test solution for automotive devices, power-management ICs and power-switching devices, the T2000 IPS can test an industry-leading number of devices in parallel by integrating various measurement resources in a single module. Minimising peripheral circuits, this dramatically reduces waiting time compared to existing systems. The T2000 IPS includes all necessary elements – such as the platform’s improved reliability, measurement accuracy and high-voltage support – in a single high-level test system.