Semiconductor temperature testing for automotive applications

1st November 2018
Source: DELTA
Posted By : Alex Lynn
Semiconductor temperature testing for automotive applications

Complete ASIC manufacturing and supply chain solution provider, DELTA Microelectronics, has announced the expansion of its semiconductor test services to include extremely high and low operating temperature testing. Automotive and industrial applications typically require stringent testing to ensure semiconductor and IC thermal behaviour and reliability at wider operating temperature ranges. 

DELTA’s temperature handler allows running test cycles between extremely high (+175°C) and extremely low ( 55°C) temperatures with full temperature control during tests. The Tri-Temp Pick and Place Handler offers throughput up to 5,300 units per hour for device sizes from 2×2 to 70×70mm.

The new handler extends DELTA’s European test facilities for testing analogue, digital, mixed signal and RF components. DELTA’s semiconductor test lab includes wafer probers, component handlers using ATE (Automatic Test Equipment), qualification services and failure analysis lab.

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