Instrument enables scalability for automotive device test

6th February 2019
Source: Cohu Inc
Posted By : Mick Elliott
Instrument enables scalability for automotive device test

Automotive power electronics ICs are complex and have stringent test requirements. Typically this limits how many IC’s can be tested in parallel, and thus inhibits the cost-effectiveness of modern highly parallel manufacturing test strategies. The Diamondx platform, with a range of power and automotive instrumentation featuring SmartMux, breaks this barrier and enables maximum efficiency.

VI1x is the latest member of this family of instruments, and it offers the right balance between uncompromising measurement quality and highest parallel test efficiency.

Leveraging a proven fully discrete channel design, the VI1x delivers up to 100mA in the +/-60V range and up to 300mA in the +/-20V range, while offering force and measure current accuracy as low as 1.2nA.

With a 64 channel SmartMux topology, the VI1x dramatically reduces loadboard PCB complexity, speeding time to market and reducing cost and risk associated with leading-edge automotive and industrial power management devices.

Christopher Lemoine, Product Marketing Director, notes: “The Diamondx already offers an impressive range of automotive and industrial instrumentation products, and the VI1x is the latest member of this family. Coupled with the AT1x instrument, the VI1x offers a complete solution for CAN and LIN bus testing, including specialised loads, detailed timing measurements, and high voltage leakage testing. The high power HPVIx and FPVIx handle high power devices up to +/-100V and up to 5A, respectively, with the ability to combine instruments for higher current or voltage. All of these instruments feature SmartMux technology, to enable higher multi-site, higher uptime, and faster time to market. The benefits for our customers are higher yield, lower cost, and better responsiveness to a fast-changing market.”


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